Brand new. Great condition. Minor shelf wear from storage - nothing major. Fast shipping from our non-smoking home. Free delivery confirmation. 2009AMA052 Additional Details ------------------------------ Subject keyword: High-resolution electron microscopy; Mechanical property; Recrystallisation; Semiconducting materials; SEM; Burgers Vector; Misfit Dislocations; Laser Annealing; Stacking Faults; Energy Density; High Resolution Electron Microscopy; Epitaxial Layers; High Resolution Transmission Electron Microscopy; Cross-sectional TEM; MOS Transistor; High Voltage Electron Microscope; Dislocation Velocity; Cl Imaging; Gate Oxide; Si Lattice; SAM; InP Substrate; CW; EBIC; Stoichiometric SiO; Acoustic Microscopy; Partial Dislocations